Art

J-GLOBAL ID：201902242400439775   Reference number：19A0926474

Vacuum effects on fatigue crack growth in submicrometre-thick freestanding copper films

サブミクロン厚の自立銅膜における疲れ亀裂成長に及ぼす真空効果【JST・京大機械翻訳】

Author (5)： Kondo Toshiyuki (Department of Mechanical Engineering, Osaka University, Osaka, Japan) ,  Shin Akihiro (Department of Mechanical Engineering, Osaka University, Osaka, Japan) ,  Akasaka Masaya (Department of Mechanical Engineering, Osaka University, Osaka, Japan) ,  Hirakata Hiroyuki (Department of Mechanical Engineering and Science, Kyoto University, Kyoto, Japan) ,  Minoshima Kohji (Department of Mechanical Engineering, Osaka University, Osaka, Japan)
Material： Fatigue & Fracture of Engineering Materials & Structures  (Fatigue Fract Eng Mater Struct)
Volume： 42  Issue： 5  Page： 1118-1129  Publication year： 2019 
JST Material Number： H0708A  ISSN： 8756-758X  CODEN： FFESEY  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Abstract/Point： To clarify vacuum effects on f...

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Thesaurus term： thin film ,  driving force ,  metallic thin film ,  *fatigue crack growth ,  fatigue damage ,  *crack ,  nucleation ,  *Copper ,  crack path ,  invasion ,  field emission scanning electron microscope

Author keywords (5)： copper ,  fatigue crack growth ,  fatigue threshold ,  thin film ,  vacuum effects

JST classification (1)： Metallic materials  (HC05020S)

Terms in the title (6)： サブ ,  厚 ,  自立 ,  銅 ,  疲れ亀裂成長 ,  真空