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J-GLOBAL ID:201902245655929118   Reference number:19A2619956

電子ビーム照射下におけるシリカガラスの構造変化解析

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Material:
Volume: 80th  Page: ROMBUNNO.20p-PB2-3  Publication year: Sep. 04, 2019 
JST Material Number: Y0055B  ISSN: 2758-4704  Document type: Proceedings
Article type: 短報  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Thesaurus term/Semi thesaurus term
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On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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Semiconductor thin films  ,  Interactions with electrons and positrons in general 
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