Art

J-GLOBAL ID：201902252529173852   Reference number：19A0801098

Radiation hardness of silicon-on-insulator pixel devices

シリコンオンインシュレータ画素デバイスの放射線硬度【JST・京大機械翻訳】

Author (11)： Hara Kazuhiko (University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan) ,  Aoyagi Wataru (University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan) ,  Sekigawa Daisuke (University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan) ,  Iwanami Shikie (University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan) ,  Honda Shunsuke (University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan) ,  Tsuboyama Toru (High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801, Japan) ,  Arai Yasuo (High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801, Japan) ,  Kurachi Ikuo (High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801, Japan) ,  Miyoshi Toshinobu (High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801, Japan) ,  Yamada Miho (High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801, Japan) ,  Ikegami Yoichi (High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki 305-0801, Japan)
Material： Nuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors and Associated Equipment  (Nucl Instrum Methods Phys Res Sect A Accel Spectrometers Detect Assoc)
Volume： 924  Page： 426-430  Publication year： 2019 
JST Material Number： D0208B  ISSN： 0168-9002  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： Silicon-on-Insulator (SOI) CMO...

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Thesaurus term： *hardness ,  ionizing radiation ,  insulator ,  *pixel ,  complementary metal oxide semiconductor ,  *radioactive ray
Semi thesaurus term： 絶縁層 ,  ピクセルセンサ , 【Automatic Indexing@JST】

Author keywords (4)： Radiation hardness ,  SOI pixel ,  TID ,  Double SOI

JST classification (2)： Experimental techniques for particle and nuclear physics in general  (BE01010F) ,  Irradiational changes semiconductors  (BK16123E)

Terms in the title (4)： シリコンオンインシュレータ ,  画素 ,  放射線 ,  硬度