Art
J-GLOBAL ID:201902264528858361   Reference number:19A0610537

Field-Emission from Finely Nicked Structures on n-Type Silicon Substrate Formed by Sandblasting Process

サンドブラスト法により形成したn型シリコン基板上の微細傷構造からの電界放出
Author (2):
Material:
Volume: E102.C  Issue:Page: 207-210(J-STAGE)  Publication year: 2019 
JST Material Number: U0468A  ISSN: 1745-1353  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

JST classification (2):
JST classification
Category name(code) classified by JST.
Thermoionic emission and field emission  ,  Other surface treatment 
Reference (16):
Terms in the title (5):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page