Art

J-GLOBAL ID：201902270852175693   Reference number：19A1477134

Measurement of polarization properties of fifth harmonic signals in apertureless-type scanning near-field optical microscopy

無開口型走査近接場光学顕微鏡法における5次高調波信号の偏光特性の測定

Author (4)： BABA Yuji (Nagaoka Univ. Technol., Niigata, JPN) ,  MATSUYA Iwao (Nagaoka Univ. Technol., Niigata, JPN) ,  NISHIKAWA Masami (Nagaoka Univ. Technol., Niigata, JPN) ,  ISHIBASHI Takayuki (Nagaoka Univ. Technol., Niigata, JPN)
Material： Japanese Journal of Applied Physics  (JJAP)
Volume： 57  Issue： 9S2  Page： 09TC04.1-09TC04.3  Publication year： Sep. 2018 
JST Material Number： G0520B  ISSN： 0021-4922  CODEN： JJAPB6  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *open type ,  *optical microscopy ,  *higher harmonic ,  *polarization property ,  pattern formation ,  Chromium ,  metallic thin film ,  resonance frequency ,  probe ,  extinction ratio ,  SN ratio ,  space resolving power ,  linearly polarized light ,  *scanning near field optical microscopy
Semi thesaurus term： open type ,  *scanning near-field optical microscopy ,  *polarization characteristics ,  patterning ,  signal-to-noise ratio

JST classification (2)： Optical instruments and techniques in general  (BD07010S) ,  Nonlinear optics  (BD05000T)

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Terms in the title (4)： 開口型 ,  走査近接場光学顕微鏡法 ,  高調波 ,  偏光特性