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J-GLOBAL ID：201902272263856972   Reference number：19A2458676

CHARACTERISTICS AND RISKS OF BROKEN BYPASS DIODE WITH INDUCED LIGHTNING

誘導雷による破壊されたバイパスダイオードの特性とリスク

Author (8)： Oke Shinichiro (National Institute of Technology, Tsuyama College, Japan) ,  Sakai Homare (National Institute of Technology, Tsuyama College, Japan) ,  Tottori Hisanori (National Institute of Technology, Tsuyama College, Japan) ,  Shimizu Yuhei (National Institute of Technology, Tsuyama College, Japan) ,  Nanno Ikuo (National Institute of Technology, Ube College, Japan) ,  Hamada Toshiyuki (National Institute of Technology, Ube College, Japan) ,  Ishikura Norio (National Institute of Technology, Yonago College, Japan) ,  Fujii Masayuki (National Institute of Technology, Oshima College, Japan)
Material： グランド再生可能エネルギー国際会議論文集(Web)  (Grand Renewable Energy Proceedings (Web))
Volume： 1  Page： 63(J-STAGE)  Publication year： 2018 
JST Material Number： U1670A  ISSN： 2434-0871  Document type： Proceedings
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Abstract/Point： Surge voltage or current induc...

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Thesaurus term： *lightning surge ,  *diode ,  fracture ,  *solar photovoltaic generation ,  lightning discharge ,  short circuit fault ,  failure ,  overheating ,  fire ,  risk assessment ,  panel
Semi thesaurus term： solar cell panel ,  *bypass diode

Author keywords (5)： photovoltaic module ,  bypass diode ,  induced lightning ,  I-V characteristics ,  temperature rising

JST classification (1)： Solar photovoltaic generation  (NB03090G)

Terms in the title (4)： 誘導雷 ,  破壊 ,  バイパスダイオード ,  リスク