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J-GLOBAL ID：201902291407762421   Reference number：19A1802552

Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy

走査透過Electron顕微鏡による局所電磁場構造の直接可視化【JST・京大機械翻訳】

Author (10)： Shibata Naoya (Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Japan) ,  Shibata Naoya (Nanostructures Research Laboratory, Japan Fine Ceramic Center, Japan) ,  Findlay Scott D. (School of Physics and Astronomy, Monash University, Victoria, Australia) ,  Matsumoto Takao (Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Japan) ,  Kohno Yuji (JEOL Ltd., Japan) ,  Seki Takehito (Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Japan) ,  Sanchez-Santolino Gabriel (Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Japan) ,  Sanchez-Santolino Gabriel (Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Cientificas ICMM-CSIC, Spain) ,  Ikuhara Yuichi (Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Japan) ,  Ikuhara Yuichi (Nanostructures Research Laboratory, Japan Fine Ceramic Center, Japan)
Material： Accounts of Chemical Research  (Acc Chem Res)
Volume： 50  Issue： 7  Page： 1502-1512  Publication year： 2017 
JST Material Number： B0966A  ISSN： 0001-4842  CODEN： ACHRE4  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： The functional properties of m...

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Thesaurus term： image ,  *scanning ,  electron microscopy ,  electric field ,  high speed ,  aberration correction ,  characterization ,  space resolving power ,  nanostructure ,  detector ,  high-resolution ,  *electromagnetic field ,  semiconductor ,  *visualization ,  image processing ,  imaging

JST classification (1)： Experimental research on molecular structure and properties  (CB01020I)

Terms in the title (5)： 走査 ,  透過 ,  顕微鏡 ,  電磁場 ,  可視化