Art

J-GLOBAL ID：202002220635095820   Reference number：20A0625556

Compositionally Graded AlGaN Nanostructures: Strain Distribution and X-ray Diffraction Reciprocal Space Mapping

組成傾斜AlGaNナノ構造:歪分布とX線回折逆空間マッピング【JST・京大機械翻訳】

Author (10)： Stanchu H. (Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, P.R. China) ,  Stanchu H. (Institute for Nanoscience and Engineering, University of Arkansas, United States) ,  Auf der Maur M. (Department of Electronic Engineering, University of Rome Tor Vergata, Italy) ,  Kuchuk A. V. (Institute for Nanoscience and Engineering, University of Arkansas, United States) ,  Mazur Yu. I. (Institute for Nanoscience and Engineering, University of Arkansas, United States) ,  Sobanska M. (Institute of Physics Polish Academy of Sciences, Poland) ,  Zytkiewicz Z. R. (Institute of Physics Polish Academy of Sciences, Poland) ,  Wu S. (Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, P.R. China) ,  Wang Z. (Institute of Fundamental and Frontier Sciences, University of Electronic Science and Technology of China, P.R. China) ,  Salamo G. (Institute for Nanoscience and Engineering, University of Arkansas, United States)
Material： Crystal Growth & Design  (Cryst Growth Des)
Volume： 20  Issue： 3  Page： 1543-1551  Publication year： 2020 
JST Material Number： W1323A  ISSN： 1528-7483  CODEN： CGDEFU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： The strain distribution in com...

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Thesaurus term： nanowire ,  three dimension ,  thin film ,  depth profile ,  *nanostructure ,  plane structure ,  interface(surface) ,  threading dislocation ,  facet ,  finite element method ,  *X-ray diffraction ,  X-ray scattering ,  *aluminum ,  *strain distribution ,  *gallium nitride

JST classification (3)： Solid-solid interface  (CB12060M) ,  Atomic and molecular clusters  (BH09030O) ,  Semiconductor thin films  (BK14040E)

Terms in the title (6)： 組成傾斜 ,  AlGaN ,  ナノ構造 ,  歪分布 ,  X線回折 ,  空間マッピング