Art

J-GLOBAL ID：202002227079574403   Reference number：20A1905780

Bottom-tracking: the possibilities and physical meaning of keeping the bottom of the frequency shift in atomic force microscopy

ボトムトラッキング:原子間力顕微鏡における周波数シフトの底を保つことの可能性と物理的意味

Author (9)： Damiron Denis (Centre for Interdisciplinary Research on Micro-Nano Methods, Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 153-8505, Japan) ,  Damiron Denis (LIMMS CNRS-IIS/UTOKYO UMI 2820, Tokyo, 153-8505, Japan) ,  Allain Pierre E. (Centre for Interdisciplinary Research on Micro-Nano Methods, Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 153-8505, Japan) ,  Allain Pierre E. (LIMMS CNRS-IIS/UTOKYO UMI 2820, Tokyo, 153-8505, Japan) ,  Allain Pierre E. (Materiaux et Phenomenes Quantiques, Universite de Paris and CNRS, 75013 Paris, France) ,  Kobayashi Dai (Centre for Interdisciplinary Research on Micro-Nano Methods, Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 153-8505, Japan) ,  Sasaki Naruo (The University of Electro-Communications, Chofu, Tokyo 182-8585, Japan) ,  Kawakatsu Hideki (Centre for Interdisciplinary Research on Micro-Nano Methods, Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 153-8505, Japan) ,  Kawakatsu Hideki (LIMMS CNRS-IIS/UTOKYO UMI 2820, Tokyo, 153-8505, Japan)
Material： Japanese Journal of Applied Physics  (JJAP)
Volume： 59  Issue： SN  Page： SN1012 (6pp)  Publication year： Aug. 2020 
JST Material Number： G0520B  ISSN： 0021-4922  CODEN： JJAPB6  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *atomic force microscope ,  *frequency shift ,  Lennard-Jones potential ,  ultra high vacuum ,  image processing ,  control scheme ,  resolving power ,  crystal orientation ,  solder ,  treatment ,  Silicon(111)
Semi thesaurus term： imaging ,  control scheme ,  atomic resolution ,  Si(111) ,  in situ treatment

JST classification (1)： Electron and ion microscopes  (BD02050B)

Terms in the title (7)： ボトム ,  トラッキング ,  原子間力顕微鏡 ,  周波数シフト ,  可能性 ,  物理 ,  意味