Art

J-GLOBAL ID：202002227746245602   Reference number：20A1531857

Electron tomography imaging methods with diffraction contrast for materials research

材料研究のための回折コントラストを用いた電子断層撮影法

Author (20)： HATA Satoshi (Kyushu Univ., Fukuoka, JPN) ,  FURUKAWA Hiromitsu (System in Frontier Inc., Tokyo, JPN) ,  GONDO Takashi (Mel-Build Corp., Fukuoka, JPN) ,  HIRAKAMI Daisuke (Nippon Steel Corp., Chiba, JPN) ,  HORII Noritaka (System in Frontier Inc., Tokyo, JPN) ,  IKEDA Ken-Ichi (Hokkaido Univ., Hokkaido, JPN) ,  KAWAMOTO Katsumi (System in Frontier Inc., Tokyo, JPN) ,  KIMURA Kosuke (Toray Res. Center, Inc., Shiga, JPN) ,  MATSUMURA Syo (Kyushu Univ., Fukuoka, JPN) ,  MITSUHARA Masatoshi (Kyushu Univ., Fukuoka, JPN) ,  MIYAZAKI Hiroya (Mel-Build Corp., Fukuoka, JPN) ,  MIYAZAKI Shinsuke (Mel-Build Corp., Fukuoka, JPN) ,  MIYAZAKI Shinsuke (Thermo Fisher Scientific, Tokyo, JPN) ,  MURAYAMA Mitsu Mitsuhiro (Virginia Tech, VA, USA) ,  MURAYAMA Mitsu Mitsuhiro (Pacific Northwest National Lab., WA, USA) ,  MURAYAMA Mitsu Mitsuhiro (Kyushu Univ., Fukuoka, JPN) ,  NAKASHIMA Hideharu (Kyushu Univ., Fukuoka, JPN) ,  SAITO Hikaru (Kyushu Univ., Fukuoka, JPN) ,  SAKAMOTO Masashi (Nippon Steel Corp., Chiba, JPN) ,  YAMASAKI Shigeto (Kyushu Univ., Fukuoka, JPN)
Material： Microscopy
Volume： 69  Issue： 3  Page： 141-155  Publication year： Jun. 2020 
JST Material Number： W1384A  ISSN： 2050-5698  Document type： Article
Article type： 文献レビュー  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *transmission electron microscope ,  scanning transmisson electron microscope ,  image reconstruction ,  *tomography ,  Microscopy ,  contrast ,  *electron diffraction ,  computed tomography
Semi thesaurus term： computed tomography ,  3D reconstruction ,  *laminagraphy ,  microscopy

JST classification (2)： Microscopy determination of structures  (BK01040E) ,  Electron diffraction methods  (BK01030T)

Terms in the title (3)： 研究 ,  電子 ,  断層撮影法