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J-GLOBAL ID：202002231020143358   Reference number：20A2654582

Total reflection X-ray fluorescence analysis of uranium in the presence of competing elements^☆

競合する元素ルビジウムナノドットの存在下でのウランの全反射蛍光X線分析【JST・京大機械翻訳】

Author (9)： Izumoto Yukie (National Institutes for Quantum and Radiological Science and Technology, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan) ,  Izumoto Yukie (Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8550, Japan) ,  Takamura Kodai (National Institutes for Quantum and Radiological Science and Technology, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan) ,  Takamura Kodai (Toho University, 2-2-1, Funabashi, Chiba 274-8510, Japan) ,  Matsuyama Tsugufumi (Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka 558-8585, Japan) ,  Nagai Hiroki (Ourstex Co., Ltd., 13-20 Honmachi, Neyagawa, Osaka 572-0832, Japan) ,  Sakai Yasuhiro (Toho University, 2-2-1, Funabashi, Chiba 274-8510, Japan) ,  Oguri Yoshiyuki (Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8550, Japan) ,  Yoshii Hiroshi (National Institutes for Quantum and Radiological Science and Technology, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan)
Material： Spectrochimica Acta. Part B. Atomic Spectroscopy  (Spectrochim Acta Pt B)
Volume： 173  Page： Null  Publication year： 2020 
JST Material Number： B0793A  ISSN： 0584-8547  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： The analysis of uranium in env...

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Thesaurus term： X-ray tube ,  *Fluorescence ,  *uranium ,  Silver ,  Strontium ,  Tungsten ,  *Rubidium ,  quantitative analysis (analytical chemistry) ,  side effect ,  alpha beam ,  *total reflection ,  computer ,  environmental sample ,  anode ,  *total reflection X-ray fluorescence

Author keywords (3)： Total-reflection X-ray fluorescence ,  Uranium ,  Silver anode X-ray tube

JST classification (1)： Physical analysis of elements in inorganic substances  (CC03022H)

Terms in the title (6)： 競合 ,  元素 ,  ルビジウム ,  ナノドット ,  ウラン ,  全反射蛍光X線分析