Art

J-GLOBAL ID：202002238862655278   Reference number：20A2339303

Evaluating Statement Deletion Mutation-based Fault Localization in Industrial Software

命令削除ミューテーションに基づく欠陥局所化の産業用ソフトウェアにおける評価

Author (5)： TOKUMOTO SUSUMU (富士通研) ,  TOKUMOTO SUSUMU (早稲田大) ,  TOKUMOTO SUSUMU (国立情報学研) ,  HON'IDEN SHIN'ICHI (早稲田大) ,  HON'IDEN SHIN'ICHI (国立情報学研)
Material： 情報処理学会論文誌ジャーナル(Web)
Volume： 61  Issue： 10  Page： 1617-1628 (WEB ONLY)  Publication year： Oct. 15, 2020 
JST Material Number： U0452A  ISSN： 1882-7764  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)

Thesaurus term： *test ,  software ,  *debugging ,  screening(inspection) ,  modification ,  *locality ,  *defect ,  *program analysis ,  *program verification
Semi thesaurus term： *software test ,  Mutation screening ,  localization ,  *欠陥局所化技術 ,  *ミューテーション解析 ,  産業用ソフトウェア

JST classification (2)： Other system programmings  (JD03070M) ,  Computer system development  (JD02010R)

Reference (31)：

• Jones, J.A. and Harrold, M.J.: Empirical Evaluation of the Tarantula Automatic Fault-Localization Technique, Proc. 20th IEEE/ACM International Conference on Automated Software Engineering, pp.273-282, Association for Computing Machinery (online), DOI:10.1145/1101908.1101949 (2005).
• Moon, S., Kim, Y., Kim, M. and Yoo, S.: Ask the Mutants: Mutating Faulty Programs for Fault Localization, 2014 IEEE Seventh International Conference on Software Testing, Verification and Validation, pp.153-162 (online), DOI: 10.1109/ICST.2014.28 (2014).
• Papadakis, M. and Le Traon, Y.: Metallaxis-FL: mutation-based fault localization, Software Testing, Verification and Reliability, Vol.25, No.5-7, pp.605-628 (2015).
• Deng, L., Offutt, J. and Li, N.: Empirical Evaluation of the Statement Deletion Mutation Operator, 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation, pp.84-93 (online), DOI: 10.1109/ICST.2013.20 (2013).
• Delamaro, M.E., Deng, L., Durelli, V.H.S., Li, N. and Offutt, J.: Experimental Evaluation of SDL and One-Op Mutation for C, 2014 IEEE 7th International Conference on Software Testing, Verification and Validation, pp.203-212 (online), DOI: 10.1109/ICST.2014.33 (2014).

Terms in the title (7)： 命令 ,  削除 ,  欠陥 ,  局所化 ,  産業 ,  ソフトウェア ,  評価