Art

J-GLOBAL ID：202002240201487527   Reference number：20A0840079

Robust surface structure analysis with reliable uncertainty estimation using the exchange Monte Carlo method

交換モンテカルロ法を用いた信頼できる不確実性推定によるロバストな表面構造解析【JST・京大機械翻訳】

Author (7)： Nagai Kazuki (Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan) ,  Anada Masato (Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan) ,  Nakanishi-Ohno Yoshinori (Graduate School of Arts and Sciences, The University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902, Japan) ,  Nakanishi-Ohno Yoshinori (Komaba Institute for Science, The University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902, Japan) ,  Nakanishi-Ohno Yoshinori (Precursory Research for Embryonic Science and Technology, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan) ,  Okada Masato (Graduate School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan) ,  Wakabayashi Yusuke (Graduate School of Science, Tohoku University, 6-3, Aramaki Aza-Aoba, Aoba-ku, Sendai 980-8578, Japan)
Material： Journal of Applied Crystallography  (J Appl Crystallogr)
Volume： 53  Issue： 2  Page： 387-392  Publication year： 2020 
JST Material Number： D0631A  ISSN： 0021-8898  CODEN： JACGAR  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： The exchange Monte Carlo (MC) ...

Register(free) or Log In to access     To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=20A0840079&from=J-GLOBAL&jstjournalNo=D0631A") }}

Thesaurus term： *Monte Carlo method ,  structure analysis ,  software ,  Bayes estimation ,  diffraction ,  structural parameter ,  *uncertainty ,  *robustness ,  oxide film ,  *surface structure ,  vector(mathematics) ,  ultrathin film ,  Web(information system) ,  oxide ,  scattering

Author keywords (5)： surface diffraction ,  Bayesian inference ,  Monte Carlo ,  oxide films ,  epitaxial films

JST classification (2)： X-ray diffraction methods  (BK01020I) ,  Structure determination and diffraction crystallography in general  (BK01010X)

Terms in the title (7)： モンテカルロ法 ,  信頼 ,  不確実性 ,  推定 ,  ロバスト ,  表面構造 ,  解析