Art

J-GLOBAL ID：202002240417694154   Reference number：20A0495679

Investigations on the Short-Circuit Degradation and its Mechanism of 1.2-KV 19-A SiC power MOSFETs

1.2kV 19A SiCパワーMOSFETの短絡劣化とその機構に関する研究【JST・京大機械翻訳】

Author (7)： Wang J. L. (South China University of Technology, Guangzhou,School of Electronic and Information Engineering,Guangdong,China,510000) ,  Chen Y. Q. (Institute of the Ministry of Industry and Information Technology Guangzhou,Science and Technology on Reliability Physics and Application of Electronic Component Laboratory No.5 Electronics Research,Guangdong,China,510610) ,  He Z. Y. (Institute of the Ministry of Industry and Information Technology Guangzhou,Science and Technology on Reliability Physics and Application of Electronic Component Laboratory No.5 Electronics Research,Guangdong,China,510610) ,  En Y. F. (Institute of the Ministry of Industry and Information Technology Guangzhou,Science and Technology on Reliability Physics and Application of Electronic Component Laboratory No.5 Electronics Research,Guangdong,China,510610) ,  Xu X. B. (South China University of Technology, Guangzhou,School of Electronic and Information Engineering,Guangdong,China,510000) ,  Huang Y. (Institute of the Ministry of Industry and Information Technology Guangzhou,Science and Technology on Reliability Physics and Application of Electronic Component Laboratory No.5 Electronics Research,Guangdong,China,510610) ,  Geng K. W. (South China University of Technology, Guangzhou,School of Electronic and Information Engineering,Guangdong,China,510000)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2019  Issue： IPFA  Page： 1-4  Publication year： 2019 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： To provide a guideline for con...

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Thesaurus term： failure ,  *silicon carbide ,  converter ,  reliability (property) ,  negative electric charge
Semi thesaurus term： ゲート酸化膜 ,  故障メカニズム ,  *パワーMOSFET , 【Automatic Indexing@JST】

JST classification (2)： Transistors  (NC03070N) ,  Graphic and image processing in general  (JE04010I)

Terms in the title (4)： SiC ,  パワーMOSFET ,  短絡 ,  研究