Art

J-GLOBAL ID：202002254550384151   Reference number：20A0475292

Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge-Response pair acquisition using Built-In Self-Test before shipping

シリコン上の擬似線形フィードバックシフトレジスタに基づく物理的非クローン化関数の実装と出荷前の組込み自己テストを用いた十分な挑戦応答対獲得【JST・京大機械翻訳】

Author (7)： Ogasahara Yasuhiro (Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Umezono 1-1-1, Tsukuba, Ibaraki, 305-8568, Japan) ,  Hori Yohei (Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Umezono 1-1-1, Tsukuba, Ibaraki, 305-8568, Japan) ,  Katashita Toshihiro (Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Umezono 1-1-1, Tsukuba, Ibaraki, 305-8568, Japan) ,  Iizuka Tomoki (School of Engineering, University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo, 113-8656, Japan) ,  Awano Hiromitsu (Graduate School of Information Science and Technology, Osaka University, 1-5 Yamadaoka, Suita, Osaka, 565-0871, Japan) ,  Ikeda Makoto (School of Engineering, University of Tokyo, Yayoi 2-11-16, Bunkyo-ku, Tokyo, 113-8656, Japan) ,  Koike Hanpei (Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Umezono 1-1-1, Tsukuba, Ibaraki, 305-8568, Japan)
Material： Integration. the VLSI Journal  (VLSI Journal)
Volume： 71  Page： 144-153  Publication year： 2020 
JST Material Number： H0891A  ISSN： 0167-9260  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： We implemented pseudo-linear f...

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Thesaurus term： uniqueness ,  *built-in self-test ,  *silicon ,  machine learning ,  semiconductor ,  capture ,  integrated circuit ,  signal generation ,  *clone ,  *shipping ,  reproducibility ,  voltage fluctuation ,  irreversibility
Semi thesaurus term： 攻撃者 ,  ハイスループット , 【Automatic Indexing@JST】

Author keywords (5)： Semiconductor ,  Integrated circuit ,  Physical unclonable function ,  Built-in self-test ,  Machine learning

JST classification (2)： Semiconductor integrated circuit  (NC03162T) ,  Special-purpose arithmetic and control units  (JC04030Y)

Terms in the title (10)： シリコン ,  擬似 ,  線形フィードバックシフトレジスタ ,  物理 ,  関数 ,  実装 ,  出荷 ,  組込み自己テスト ,  応答 ,  獲得