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J-GLOBAL ID:202002256344428215   Reference number:20A1829909

Observing the Delamination Interface in Multi Layered Thin Films with a MgAg Alloy Top Layer and Organic Semiconductor under Layers on a Flexible Substrate

フレキシブル基板上のMgAg合金トップ層と有機半導体下層による多層薄膜における剥離界面の観察
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Volume:Page: 151-156  Publication year: Aug. 2020 
JST Material Number: F1885A  ISSN: 2189-4752  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Printed circuits  ,  Measurement,testing and reliability of solid-state devices 
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Reference (8):
  • 1 Forrest, S.: 7th International Conference on Electroluminescence of Molecular Materials and Related Phenomena,(2008).
  • 2 Kobayashi, T., Yokoyama, T., Utsumi, U., Kanematsu h. and Masuda, T.: Improvement in the Ductility of Organic Semiconductor Materials Used in a Flexible Organic Light Emitting Diode, J. JSEM,14(2014),s194-s199.
  • 3 Chiang, C. J., Winscom, C., Bull, S. and Monkmana, A.: Mechanical modeling of flexible OLED devices, Organic Electronics, 10 (2009), 1268-1274.
  • 4 Kobayashi, T., Yokoyama, T., Utsumi, Y., Kanematsu, H., and Masuda, T.: Study on Evaluation Methods for Mechanical Properties of Organic Semiconductor Materials, Journal of Physics: Conference Series, 433 (2013), 012009.
  • 5 Kobayashi, T., Ikeda, H., Utsumi, U., Kanematsu H., Masuda, T. and Yamamoto, M.: Measurement of Reduced Elastic Modulus of Organic Semiconductor Materials for Flexible Organic Light Emitting Diode, J. JSEM, 14 (2014), s189-s193.
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