Art

J-GLOBAL ID：202002268036196895   Reference number：20A2241951

Time-resolved X-ray photoelectron diffraction using an angle-resolved time-of-flight electron analyzer

角度分解飛行時間電子分析器を用いた時間分解X線光電子回折

Author (12)： Ang Artoni Kevin R. (Structural Physics Laboratory, Nagoya Institute of Technology, Gokiso, Showa, Nagoya, Aichi 466-8555, Japan) ,  Fukatsu Yuichiro (Structural Physics Laboratory, Nagoya Institute of Technology, Gokiso, Showa, Nagoya, Aichi 466-8555, Japan) ,  Kimura Koji (Structural Physics Laboratory, Nagoya Institute of Technology, Gokiso, Showa, Nagoya, Aichi 466-8555, Japan) ,  Yamamoto Yuta (Structural Physics Laboratory, Nagoya Institute of Technology, Gokiso, Showa, Nagoya, Aichi 466-8555, Japan) ,  Yonezawa Takahiro (School of Materials Science, Japan Advanced Institute of Science and Technology (JAIST), 1-1, Asahidai, Nomi, Ishikawa 923-1292, Japan) ,  Nitta Hirokazu (School of Materials Science, Japan Advanced Institute of Science and Technology (JAIST), 1-1, Asahidai, Nomi, Ishikawa 923-1292, Japan) ,  Fleurence Antoine (School of Materials Science, Japan Advanced Institute of Science and Technology (JAIST), 1-1, Asahidai, Nomi, Ishikawa 923-1292, Japan) ,  Yamamoto Susumu (The Institute for Solid State Physics, The University of Tokyo, Kashiwa, Chiba 277-8581, Japan) ,  Matsuda Iwao (The Institute for Solid State Physics, The University of Tokyo, Kashiwa, Chiba 277-8581, Japan) ,  Yamada-Takamura Yukiko (School of Materials Science, Japan Advanced Institute of Science and Technology (JAIST), 1-1, Asahidai, Nomi, Ishikawa 923-1292, Japan) ,  Hayashi Kouichi (Structural Physics Laboratory, Nagoya Institute of Technology, Gokiso, Showa, Nagoya, Aichi 466-8555, Japan) ,  Hayashi Kouichi (Frontier Research Institute for Materials Science, Nagoya Institute of Technology, Gokiso, Showa, Nagoya, Aichi 466-8555, Japan)
Material： Japanese Journal of Applied Physics  (JJAP)
Volume： 59  Issue： 10  Page： 100902 (5pp)  Publication year： Oct. 2020 
JST Material Number： G0520B  ISSN： 0021-4922  CODEN： JJAPB6  Document type： Article
Article type： 短報  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *angle resolved spectroscopy ,  *TOF ,  measurement ,  *X-ray photoelectron diffraction ,  resolving power ,  structure ,  X-Ray Diffraction ,  epitaxy ,  silicon ,  time resolved method ,  local structure ,  silicene ,  laser induced
Semi thesaurus term： atomic resolution ,  epitaxial growth

JST classification (1)： Electron spectroscopy  (BM09060K)

Terms in the title (5)： 分解 ,  飛行時間 ,  電子 ,  分析器 ,  X線光電子回折