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J-GLOBAL ID：202002287957369668   Reference number：20A0145843

Direct detection of rare earth ion distributions in gallium nitride and its influence on growth morphology

窒化ガリウム中の希土類イオン分布の直接検出とその成長形態への影響【JST・京大機械翻訳】

Author (12)： Mitchell B. (Department of Physics, West Chester University, West Chester, Pennsylvania 19383, USA) ,  Timmerman D. (Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan) ,  Zhu W. (Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan) ,  Lin J. Y. (Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409, USA) ,  Jiang H. X. (Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409, USA) ,  Poplawsky J. (Center for Nanomaterials Science, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830, USA) ,  Ishii R. (Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8510, Japan) ,  Kawakami Y. (Department of Electronic Science and Engineering, Kyoto University, Kyoto 615-8510, Japan) ,  Dierolf V. (Department of Physics, Lehigh University, Bethlehem, Pennsylvania 18015, USA) ,  Tatebayashi J. (Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan) ,  Ichikawa S. (Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan) ,  Fujiwara Y. (Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan)
Material： Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)
Volume： 127  Issue： 1  Page： 013102-013102-9  Publication year： 2020 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： The dopant distribution and su...

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Thesaurus term： photoluminescence ,  dopant ,  europium ,  *gallium nitride ,  threading dislocation ,  resolving power ,  *rare earth element ,  high-resolution ,  atomic force microscope ,  doping ,  three dimension ,  erbium ,  structural property
Semi thesaurus term： 画像化 ,  原子プローブトモグラフィー , 【Automatic Indexing@JST】

JST classification (2)： Lattice defects in semiconductors  (BK12040Q) ,  Semiconductor thin films  (BK14040E)

Terms in the title (5)： 窒化ガリウム ,  希土類イオン ,  分布 ,  成長 ,  形態