Art

J-GLOBAL ID：202102232192166328   Reference number：21A0328601

Longitudinal and transverse spatial beam profile measurement of relativistic electron bunch by electro-optic sampling

電気光学サンプリングによる相対論的電子バンチの縦および横空間ビームプロファイル測定

Author (9)： Ota Masato (Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan) ,  Kan Koichi (Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka, 567-0047, Japan) ,  Komada Soichiro (Department of Electrical and Electronic Engineering, Mie University, Tsu, Mie, 514-8507, Japan) ,  Arikawa Yasunobu (Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan) ,  Shimizu Tomoki (Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan) ,  Mag-usara Valynn Katrine (Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan) ,  Sakawa Youichi (Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan) ,  Matsui Tatsunosuke (Department of Electrical and Electronic Engineering, Mie University, Tsu, Mie, 514-8507, Japan) ,  Nakajima Makoto (Institute of Laser Engineering, Osaka University, Suita, Osaka, 565-0871, Japan)
Material： Applied Physics Express  (APEX)
Volume： 14  Issue： 2  Page： 026503 (5pp)  Publication year： Feb. 2021 
JST Material Number： F0599C  ISSN： 1882-0778  CODEN： APEPC4  Document type： Article
Article type： 短報  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： sampling ,  *beam bunching ,  *relativity ,  optical switch ,  distribution ,  pulse ,  probe ,  length ,  delay ,  radial direction ,  *electron bunch ,  *beam profile ,  electro-optical switch ,  beam size ,  distribution of electric field
Semi thesaurus term： sampling ,  electric field distribution ,  size ,  time delay

JST classification (1)： Electron and ion beams  (BD02030F)

Terms in the title (5)： 光学 ,  サンプリング ,  相対論的電子 ,  縦 ,  ビームプロファイル