Art

J-GLOBAL ID：202102255523044978   Reference number：21A0155820

Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements

AFMに基づくナノメカニカル測定による高分子における高さゆらぎ誘起の系統的誤差の補正【JST・京大機械翻訳】

Author (6)： Mao Lu (School of Materials Science and Engineering, Zhengzhou University, No.100 Science Avenue, Zhengzhou, Henan, 450001, China) ,  Fujinami So (Office of Society-Academia Collaboration for Innovation, Kyoto University, Gokasho, Uji, Kyoto, 611-0011, Japan) ,  Liu Wentao (School of Materials Science and Engineering, Zhengzhou University, No.100 Science Avenue, Zhengzhou, Henan, 450001, China) ,  Liu Hao (School of Materials Science and Engineering, Zhengzhou University, No.100 Science Avenue, Zhengzhou, Henan, 450001, China) ,  Nakajima Ken (Department of Chemical Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8550, Japan) ,  Nakajima Ken (Department of Applied Physics, Graduate School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku Tokyo, 113-8656, Japan)
Material： Polymer Testing  (Polym Test)
Volume： 93  Page： Null  Publication year： 2021 
JST Material Number： C0752B  ISSN： 0142-9418  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Abstract/Point： AFM-based nanomechanical measu...

Register(free) or Log In to access     To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=21A0155820&from=J-GLOBAL&jstjournalNo=C0752B") }}

Thesaurus term： Young's modulus ,  mechanical property ,  polymer ,  *fluctuation ,  reliability(property) ,  mechanical measurement ,  systematic error ,  approximation method ,  *macromolecule ,  characterization ,  atomic force microscope
Semi thesaurus term： 補正法 ,  PMC【材料】 ,  ポリスチレンビーズ ,  サンプル表面 , 【Automatic Indexing@JST】

Author keywords (4)： Nanomechanical measurement ,  Height-fluctuation ,  Atomic force microscopy ,  Systematic errors

JST classification (3)： Mechanical properties  (YH02022L) ,  Rubber and plastic material testing  (HB03000F) ,  Structure and morphology of polymer solids  (CG02022M)

Terms in the title (6)： AFM ,  高分子 ,  高さ ,  ゆらぎ ,  誘起 ,  系統的誤差