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ArticleJ-GLOBAL ID:200902001859080934整理番号:86A0158643

Analysis of solids by secondary ion and sputtered neutral mass spectrometry.

2次イオンおよびスパッタ中性質量分析法による固体の解析

著者:GNASER H(Kernforschungsanlage Juelich, Fed. Rep. Germany)、FLEISCHHAUER J(Kernforschungsanlage Juelich, Fed. Rep. Germany)、HOFER W O(Kernforschungsanlage Juelich, Fed. Rep. Germany)
資料名:Appl Phys A 巻:37 号:4 ページ:211-220
発行年:1985年08月
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About J-GLOBAL

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The system enables searches of similar kinds of content through linkage with external sites.
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