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J-GLOBAL ID:200902051359874427   Reference number:84A0450741

Determination of grain boundary impurity effects in polycrystalline silicon.

多結晶性シリコンにおける粒界不純物効果の決定
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Volume:Issue: 2 Pt 2  Page: 1120-1122  Publication year: Apr. 1984 
JST Material Number: C0789B  ISSN: 0734-2101  CODEN: JVTAD6  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Lattice defects in semiconductors  ,  Photoconduction,photoelectromotive force 
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