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J-GLOBAL ID:201702272938038331   Reference number:17A0392361

Characteristics of Compactness of SiO_2Thin Films Prepared byPECVD Method

PECVD法によりSIO_2薄膜の緻密性を特性化した。【JST・京大機械翻訳】
Author (5):
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Volume: 53  Issue: 12  Page: 123101-1-123101-6  Publication year: 2016 
JST Material Number: C2698A  ISSN: 1006-4125  Document type: Article
Article type: 原著論文  Country of issue: China (CHN)  Language: CHINESE (ZH)
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Plasma enhanced chemical vapor...
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Oxide thin films 
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