Sho Yuasa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue. Effective utilization of register-transfer paths based on enhancing multiplexer functions in RTL scan design. Digest of Papers 19th IEEE Workshop on RTL and High Level Testing (WRTLT '18). 2018. 1-6
Tsuyoshi Iwagaki, Sho Yuasa, Hideyuki Ichihara, Tomoo Inoue. Experimental evaluation of test cost reduction by scan chain testing in RTL scan circuits. Digest of Papers 18th IEEE Workshop on RTL and High Level Testing (WRTLT '17). 2017. 1-6