Surface Structure Analysis by Transmission Electron Diffraction
Surface Study by UHV High-resolution Electron Microscope with Omega-type Energy Filter
Atomic Structure and Quantumized Conductance of Nanowire Studied by UHV Electron Microscopy and STM.
透過電子回折法による表面構造解析
超高真空エネルギーフィルター電子顕微鏡による表面研究
電子顕微鏡-STM法によるナノワイヤの原子構造と量子化電子伝導の研究
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論文 (27件):
Takayanagi, K., Oshima, Y., Lee, S., Tanaka, T., Tanishiro, Y. Nanocycles of materials' transport studied by in-situ electron microscopy and diffraction. Journal of Physics: Conference Series. 2014. 522. 012005 (6 pp.)
Takumi Sannomiya, Hidetaka Sawada, Tomohiro Nakamichi, Fumio Hosokawa, Yoshio Nakamura, Yasumasa Tanishiro, Kunio Takayanagi. Determination of aberration center of Ronchigram for automated aberration correctors in scanning transmission electron microscopy. ULTRAMICROSCOPY. 2013. 135. 71-79
高柳 邦夫, 大島 義文, 李 少淵, 田中 崇之, 谷城 康眞. 収差補正電子顕微鏡と表面・界面科学. 表面科学 : hyomen kagaku = Journal of the Surface Science Society of Japan. 2013. 34. 5. 226-233
T. Harumoto, T. Sannomiya, Y. Matsukawa, S. Muraishi, J. Shi, Y. Nakamura, H. Sawada, T. Tanaka, Y. Tanishiro, K. Takayanagi. Controlled polarity of sputter-deposited aluminum nitride on metals observed by aberration corrected scanning transmission electron microscopy. JOURNAL OF APPLIED PHYSICS. 2013. 113. 8
Mitome Masanori, Sawada Hidetaka, Kondo Yukihito, Tanishiro Yasumasa, Takayanagi Kunio. Element discrimination in a hexagonal boron nitride nanosheet by aberration corrected transmission electron microscopy. ULTRAMICROSCOPY. 2012. 122. 6-11
Spectro-microscopy by TEM-SEM
Lecture Note in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research 2002
Spectro-microscopy by TEM-SEM
Lecture Note in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research 2002
表面物性測定
丸善 実験物理学講座 2001
Energy Filtering in UHV Reflection Electron Microscopy
Microbeam Analysis 2000 (Proc. 2nd Conf. of International Union of Microbeam Analysis Societies, Kailua-Kona, Hawaii, 2000, Eds. D.B.Wiliams and R.Shimizu) IOP Conf. Series 2000
Observation of Deformation and Rupture Process of Gold Nanowire Under the Stress
(Physical Society of Japan 2006)
Study of Structure and Electric Conduction of Silver Nanowires Using TEM-STM
(Physical Society of Japan 2006)
Observation of Structure and Conductance Measurement of Silver Nanowires Using TEM-STM III
(Physical Society of Japan 2006)
Structure Change of Au Nanowire Caused by Stress Change
(Physical Society of Japan 2006)
Development of Image Recording System for In-situ High-resolution TEM Observation: Lens-coupling Electron Multiplier CCD (EM-CCD) System
(The 16th International Microscopy Congress 2006)
2004 - SSSJ Paper Award, The Surface Science Society of Japan
2004 - 日本表面科学会論文賞
2001 - Seto Award, Japanese Society of Electron Microscopy
2001 - 日本電子顕微鏡学会学会賞(瀬藤賞)
1990 - Tejima Award (Nakamura Prize), Tejima Organization
1990 - 手島記念研究賞(中村研究賞)
1987 - Paper Award, Japan Society of Applied Physics
1987 - 応用物理学会賞C(会誌賞)
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所属学会 (10件):
The Physical Society of Japan
, The Crystallographic Society of Japan
, American Physical Society
, The Japanese Society of Microscopy
, The Surface Science Society of Japan
, 日本物理学会
, 日本結晶学会
, アメリカ物理学会
, 日本顕微鏡学会
, 日本表面科学会