H. Kiuchi, M. Tajima, F. Higuchi, A. Ogura, N. Iida, S. Tachibana, I. Masada and E. Nishijima. Jpn. J. Appl. Phys. 2017. 56. 7. 070305-1-070305-3
Fumito Higuchi, Michio Tajima, Atsushi Ogura. Photoluminescence Due to Early Stage of Oxygen Precipitates in Multicrystalline Si for Solar CellsFumito Higuchi, Michio Tajima and Atsushi Ogura. Jpn. J. Appl. Phys. 2017. 56. 6. 070308-1-070308-3
Michio Tajima, Kei Nakagawa, Hirotastu Kiuchi, Fumito Higuchi, Atsushi Ogura. Recent Advances in Quantitative Impurity Analysis by Photoluminescence Technique: High Concentration of Dopant Impurities and Low Concentration of Carbon. Proc. 7th Int. Symp. Advanced Science and Technology of Silicon Materials (JSPS Si Symposium). 2016. 185-189
Quantification of low-level carbon in Si by photoluminescence at liquid nitrogen temperature and higher after electron irradiation
(10th International Workshop on Crystalline Silicon for Solar Cells (CSSC-10) 2018)
Determination of carbon concentration in phosphorus-doped n-type Czochralski-grown Si crystals by liquid-nitrogen-temperature photoluminescence after electron irradiation
(27th International Photovoltaic Science and Engineering Conference (PVSEC-27) 2017)
Systematic Variation of Photoluminescence with Dopant Impurities in Highly Doped and Highly Compensated Si
(17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII) 2017)