Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian. Scan chain grouping for mitigating ir-drop-induced test data corruption. Proceedings of the Asian Test Symposium. 2018. 140-145
Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian. Scan chain grouping for mitigating ir-drop-induced test data corruption. Proceedings of the Asian Test Symposium. 2018. 140-145