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J-GLOBAL ID:200901055617687191   Update date: Mar. 24, 2024

EISUKE TOKUMITSU

トクミツ エイスケ | EISUKE TOKUMITSU
Affiliation and department:
Research field  (1): Electronic devices and equipment
Research keywords  (1): 半導体デバイス、酸化物半導体、強誘電体、薄膜トランジスタ、不揮発性メモリ、パワーデバイス、溶液プロセス
Research theme for competitive and other funds  (30):
  • 2020 - 2023 Investigation of steep-slope transistor using ferroelectric polarization dynamics
  • 2019 - 2023 単一アナログデバイスと局所的学習則を用いるリアルニューロモーフィックシステム
  • 2014 - 2016 Solution-processed SiC Films and Its Application to Power Devices
  • 2012 - 2015 Proposal of varialbe-area electrode structure by field effect and its application to variable capacitors
  • 2012 - 2014 Current control of graphene channel transistors using semiconductor contacts
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Papers (62):
MISC (214):
Books (4):
  • Oxide-Channel Ferroelectric-Gate Thin Film Transistors with Nonvolatile Memory Function
    “Ferroelectric-Gate Field Effect Transistor Memories”,Springer, 2016. 2016
  • Applications of Oxide Channel Ferroelectric-Gate Thin Film Transistors
    “Ferroelectric-Gate Field Effect Transistor Memories”, Springer, 2016. 2016
  • Materials and physics for nonvolatile memories II : spring 2010, April 5-9, San Francisco, California, U.S.A.
    Materials Research Society 2010 ISBN:9781605112275
  • 電子物性・材料の事典
    朝倉書店 2006
Lectures and oral presentations  (211):
  • Coating properties of chemical solution processed MoS2 thin films on various oxides
    (2017 European Materials Research Society (E-MRS) Spring Meeting, Strasbourg, France, May 22-26, 2017. paper Q.PM.4 2017)
  • Chemical Solution Process of In-Based Oxides and MoS2 for Thin Film Transistors
    (The 6th International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies (EM-NANO 2017), June 18-321, 2017, Fukui, paper PA2-1-1 2017)
  • Direct Imprinting of Oxide Precursor Gel for New Fabrication Process of Thin Film Transistors
    (The 6th International Symposium on Organic and Inorganic Electronic Materials and Related Nanotechnologies (EM-NANO 2017), June 18-321, 2017, Fukui, paper PO3-47 2017)
  • Investigation of Nb-Zr-O thin film using sol-gel coating
    (82016 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD2016), paper B3-3(oral) July 4 - 6, 2016Hakodate Kokusai Hotel, Hakodate, Japan 2017)
  • Fabrication of MoS2 thin films on oxide-dielectric-covered substrates
    (Compound Semiconductor Week, June 26-30, 2016 Toyama International Conference Center, Toyama paper MoP-ISCS-121 2017)
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Education (3):
  • - 1987 0192 東京工業大学 理工学研究科 電子物理工学
  • - 1987 Tokyo Institute of Technology Graduate School, Division of Science and Engineering
  • - 1982 Tokyo Institute of Technology School of Engineering
Professional career (1):
  • Doctor of Engineering (Tokyo Institute of Technology)
Work history (6):
  • 2007 - Tokyo Institute of Technology Precision and Intelligence Laboratory Associate Professor
  • 2004 - Tokyo Institute of Technology Precision and Intelligence Laboratory Associate Professor
  • 2002 - Associate Professor at Research Institute of Electrical Communication, Tohoku University
  • 1992 - Associate Professor at Precision and Intelligence Laboratory, Tokyo Institute of Technology
  • 1988 - AT&T Bell Laboratories Member of Technical Staff
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Association Membership(s) (5):
応用物理学会 ,  電子情報通信学会 ,  IEEE ,  IEEE ,  Materials Research Society
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