Research field (1):
Thin-film surfaces and interfaces
Research keywords (4):
金属・半導体超薄膜層の評価
, 金属-半導体原子界面
, Characterization of Metal and Semiconductor Ultra thin films
, Atomic Interfaces of Metal-Semiconductor
Research theme for competitive and other funds (4):
金属-半導体の電界放射エネルギー電子分光による研究
金属-半導体原子界面の高電場顕微鏡による評価
Study on Matal-Semiconductor with Field Emission Energy Spectroscopy
Evaluation of Metal-Semiconductor atomic Interfaces with High field Microscopies.