Rchr
J-GLOBAL ID：200901061711205630   Update date: Dec. 18, 2024

YASUMASA TANISHIRO

YASUMASA TANISHIRO
Research field  (3)： Thin-film surfaces and interfaces ,  Applied materials ,  Semiconductors, optical and atomic physics
Research theme for competitive and other funds  (26)：
  • 2007 - 2011 Angle Resolved Spectroscopic Observation of Electron Beam induced Radiation from Nano-Structures excited by Low-Energy Electron Nano-probe
  • 2004 - 2006 Observation of quantum effect of catalyst activity of Gold Nanoisland / MO_x
  • 2004 - Development of 0.05nm resolution aberration corrected TEM/STEM.
  • 2004 - 0.05nm分解能・透過-走査透過型・収差補正電子顕微鏡の開発
  • 2000 - 2003 Quantum Contact
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Papers (27)：
  • Takayanagi, K., Oshima, Y., Lee, S., Tanaka, T., Tanishiro, Y. Nanocycles of materials' transport studied by in-situ electron microscopy and diffraction. Journal of Physics: Conference Series. 2014. 522. 012005 (6 pp.)
  • Takumi Sannomiya, Hidetaka Sawada, Tomohiro Nakamichi, Fumio Hosokawa, Yoshio Nakamura, Yasumasa Tanishiro, Kunio Takayanagi. Determination of aberration center of Ronchigram for automated aberration correctors in scanning transmission electron microscopy. ULTRAMICROSCOPY. 2013. 135. 71-79
  • TAKAYANAGI Kunio, OSHIMA Yoshifumi, LEE Soyeon, TANAKA Takayuki, TANISHIRO Yasumasa. Electron Microscopy for "Nano-in-Macro". J. Surf. Sci. Soc. Jpn. 2013. 34. 5. 226-233
  • T. Harumoto, T. Sannomiya, Y. Matsukawa, S. Muraishi, J. Shi, Y. Nakamura, H. Sawada, T. Tanaka, Y. Tanishiro, K. Takayanagi. Controlled polarity of sputter-deposited aluminum nitride on metals observed by aberration corrected scanning transmission electron microscopy. JOURNAL OF APPLIED PHYSICS. 2013. 113. 8
  • Mitome Masanori, Sawada Hidetaka, Kondo Yukihito, Tanishiro Yasumasa, Takayanagi Kunio. Element discrimination in a hexagonal boron nitride nanosheet by aberration corrected transmission electron microscopy. ULTRAMICROSCOPY. 2012. 122. 6-11
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MISC (230)：
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Books (56)：
  • 表面物性工学ハンドブック 第2版
    丸善 2007
  • Spectro-microscopy by TEM-SEM
    Lecture Note in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research 2002
  • Spectro-microscopy by TEM-SEM
    Lecture Note in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research 2002
  • 表面物性測定
    丸善 実験物理学講座 2001
  • Energy Filtering in UHV Reflection Electron Microscopy
    Microbeam Analysis 2000 (Proc. 2nd Conf. of International Union of Microbeam Analysis Societies, Kailua-Kona, Hawaii, 2000, Eds. D.B.Wiliams and R.Shimizu) IOP Conf. Series 2000
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Lectures and oral presentations  (32)：
  • Observation of Deformation and Rupture Process of Gold Nanowire Under the Stress
    (Physical Society of Japan 2006)
  • Study of Structure and Electric Conduction of Silver Nanowires Using TEM-STM
    (Physical Society of Japan 2006)
  • Observation of Structure and Conductance Measurement of Silver Nanowires Using TEM-STM III
    (Physical Society of Japan 2006)
  • Structure Change of Au Nanowire Caused by Stress Change
    (Physical Society of Japan 2006)
  • Development of Image Recording System for In-situ High-resolution TEM Observation: Lens-coupling Electron Multiplier CCD (EM-CCD) System
    (The 16th International Microscopy Congress 2006)
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Education (3)：
  • - 1980 Tokyo Institute of Technology Graduate School, Division of Science and Engineering
  • - 1980 Tokyo Institute of Technology Science of Engineering
  • - 1978 Tokyo Institute of Technology School of Science Dept. of Physics
Professional career (1)：
  • Master of Science
Work history (8)：
  • 1998 - 2007 :Tokyo Institute of Technology Graduate School of Science and Engineering Assistant Professor
  • 1998 - 2007 :東京工業大学 大学院理工学研究科 助手
  • 2007 - -:Tokyo Institute of Technology Graduate School of Science and Engineering Assistant Professor
  • 2007 - -:東京工業大学 大学院理工学研究科 助教
  • 1986 - 1998 :Tokyo Institute of Technology Faculty of Science Assistant Professor
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Committee career (6)：
  • 2007 - 2007 日本結晶学会 平成19年度年会実行委員
  • 2007 - 2007 日本結晶学会 平成19年度年会 実行委員
  • 2003 - 2005 日本顕微鏡学会 関東支部幹事
  • 2003 - 2005 日本顕微鏡学会 超分解能電子顕微鏡分科会 責任者、関東支部幹事、関東支部幹事 、関東支部評議員
  • 1992 - 1993 日本物理学会 表面界面分科世話人
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Awards (8)：
  • 2004 - SSSJ Paper Award, The Surface Science Society of Japan
  • 2004 - 日本表面科学会論文賞
  • 2001 - Seto Award, Japanese Society of Electron Microscopy
  • 2001 - 日本電子顕微鏡学会学会賞(瀬藤賞)
  • 1990 - Tejima Award (Nakamura Prize), Tejima Organization
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Association Membership(s) (10)：
The Physical Society of Japan ,  The Crystallographic Society of Japan ,  American Physical Society ,  The Japanese Society of Microscopy ,  The Surface Science Society of Japan ,  日本物理学会 ,  日本結晶学会 ,  アメリカ物理学会 ,  日本顕微鏡学会 ,  日本表面科学会
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