Rchr
J-GLOBAL ID:201101002132444969   Update date: Nov. 16, 2024

Kobayashi Kazutoshi

コバヤシ カズトシ | Kobayashi Kazutoshi
Affiliation and department:
Homepage URL  (1): http://kaken.nii.ac.jp/ja/r/70252476
Research field  (4): Information networks ,  Computer systems ,  Communication and network engineering ,  Electronic devices and equipment
Research keywords  (26): Soft Error ,  VLSI ,  Computing in Memory ,  低ビットレート ,  並列処理 ,  ばらつき ,  画像圧縮 ,  System C ,  FPGA ,  再構成可能性 ,  信頼性 ,  テストベクタ ,  動画像処理 ,  並列プロセッサ ,  プロセッサ ,  動作合成 ,  柔軟な処理 ,  ハードウエア設計 ,  LSIテスタ ,  シミュレーション ,  コンフィギャラブル ,  一時故障 ,  テスト ,  期待値比較 ,  SIMD ,  協調設計
Research theme for competitive and other funds  (25):
  • 2022 - 2025 スケーラブルな高集積量子誤り訂正システムの開発
  • 2018 - 2023 高信頼性を要求される常時起動デバイスの特性変動の実測評価と動作レベルのモデル化
  • 2017 - 2021 Intelligently controled device simulator utlizing small numer of dominant time constant approximation
  • 2015 - 2019 An IoT that can keep on running over years efficiently and reliably
  • 2010 - 2012 Integrated Circuit Design for Robust Operation under Low Supply Voltage
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Papers (330):
  • Jun Furuta, Shotaro Sugitani, Ryuichi Nakajima, Kazutoshi Kobayashi. A Partially-redundant Flip-flip Suitable for Mitigating Single Event Upsets in a FD-SOI Process with Low Performance Overhead. 2024 IEEE International Reliability Physics Symposium (IRPS). 2024
  • Ryuichi Nakajima, Shotaro Sugitani, Haruto Sugisaki, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi, Makoto Sakai. An Approach to Neutron-Induced SER Evaluation Using a Clinical 290 MeV/ u Carbon Beam and Particle Transport Simulations. 2024 IEEE International Reliability Physics Symposium (IRPS). 2024
  • Jun FURUTA, Shotaro SUGITANI, Ryuichi NAKAJIMA, Takafumi ITO, Kazutoshi KOBAYASHI. Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy-ion and Neutron Irradiation. IEICE Transactions on Electronics. 2024
  • Ryuichi NAKAJIMA, Takafumi ITO, Shotaro SUGITANI, Tomoya KII, Mitsunori EBARA, Jun FURUTA, Kazutoshi KOBAYASHI, Mathieu LOUVAT, Francois JACQUET, Jean-Christophe ELOY, et al. Soft-error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies. IEICE Transactions on Electronics. 2024
  • Yudai Kawakami, Makoto Sakai, Hiroaki Masuda, Masami Miyajima, Takao Kanzaki, Kazutoshi Kobayashi, Tatsuya Ohno, Hiroshi Sakurai. The Contribution of Secondary Particles Following Carbon Ion Radiotherapy to Soft Errors in CIEDs. IEEE Open Journal of Engineering in Medicine and Biology. 2024. 5. 157-162
more...
MISC (219):
Books (5):
  • SystemVerilogによるFPGA/ディジタル回路設計入門
    オーム社 2023 ISBN:9784274231018
  • ウェスト&ハリスCMOS VLSI回路設計
    丸善出版 2014 ISBN:9784621087213
  • 集積回路工学
    オーム社 2013 ISBN:9784274214271
  • アナログ電子回路
    オーム社 2013 ISBN:9784274213441
  • ディジタル集積回路の設計と試作
    培風館 2000 ISBN:4563035475
Education (2):
  • 1991 - 1993 Kyoto University Graduate School of Engineering Department of Electronic Science and Engineering
  • 1987 - 1991 Kyoto University Faculty of Engineering Department of Electronics
Professional career (1):
  • 博士(工学) (京都大学)
Work history (6):
  • 2009 - 現在 Kyoto Institute of Technology Graduate School of Science and Technology Professor
  • 2004/04 - 2009/03 Kyoto University Graduate School of Informatics Department of Communications and Computer Engineering Associate Professor
  • 2002/04 - 2004/03 The University of Tokyo VLSI (Very Scale Integration Large) Design and Education Center
  • 2001/04 - 2002/03 Kyoto University Graduate School of Informatics Department of Communications and Computer Engineering Associate Professor
  • 1998/04 - 2001/03 Kyoto University Graduate School of Informatics Department of Communications and Computer Engineering Assistant Professor
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Awards (1):
  • 2021/09 - Institute of Electronics, Information and Communication Engineers Electronics Society Award
Association Membership(s) (4):
IEEE ,  THE JAPAN SOCIETY OF APPLIED PHYSICS ,  INFORMATION PROCESSING SOCIETY OF JAPAN ,  THE INSTITUTE OF ELECTRONICS, INFORMATION AND COMMUNICATION ENGINEERS
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