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J-GLOBAL ID:201101047657309845   Update date: Jan. 30, 2024

Miyahara Yoichi

ミヤハラ ヨウイチ | Miyahara Yoichi
Affiliation and department:
Job title: Assistant Professor
Homepage URL  (1): https://miyahara.wp.txstate.edu/
Research field  (2): Nano/micro-systems ,  Nanomaterials
Research keywords  (4): Quantum dots ,  Nanoelectronics ,  Scanning Probe Microscopy ,  トンネル分光
Research theme for competitive and other funds  (2):
  • 1996 - 1996 角度分解型トンネル分光による擬二次元物質の電子状態の異方性の観測
  • 1995 - 1995 ブロッホ状態間トンネリングにおける横方向波数保存則の検証
Papers (68):
  • Zeno Schumacher, Rasa Rejali, Megan Cowie, Andreas Spielhofer, Yoichi Miyahara, Peter Grutter. Charge Carrier Inversion in a Doped Thin Film Organic Semiconductor Island. ACS Nano. 2021. 15. 6. 10377-10383
  • Yoichi Miyahara, Harrisonn Griffin, Antoine Roy-Gobeil, Ron Belyansky, Hadallia Bergeron, José Bustamante, Peter Grutter. Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements. EPJ Techniques and Instrumentation. 2020
  • Zeno Schumacher, Rasa Rejali, Raphael Pachlatko, Andreas Spielhofer, Philipp Nagler, Yoichi Miyahara, David G Cooke, Peter Grütter. Nanoscale force sensing of an ultrafast nonlinear optical response. Proceedings of the National Academy of Sciences of the United States of America. 2020. 117. 33. 19773-19779
  • T. St-Denis, K. Yazda, X. Capaldi, J. Bustamante, M. Safari, Y. Miyahara, Y. Zhang, P. Grutter, W. Reisner. An apparatus based on an atomic force microscope for implementing tip-controlled local breakdown. Review of Scientific Instruments. 2019
  • Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro, Tyler Enright, Peter Grutter. Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy. Sensors. 2019. 19. 20. 4510-4510
more...
MISC (23):
  • Miyahara, Yoichi, Cockins, Lynda, Grütter, Peter. Electrical characterization of low dimensional systems. Kelvin Probe Force Microscopy. 2012. 48. 175-199
  • Hirota Yusuke, Itiyama K., Hosoi N., Miyahara Y., Ozaki H. Investigation of thermoelectromotive force in Charge Density Wave State of TiSe_<2-x>S_x. Meeting abstracts of the Physical Society of Japan. 2001. 56. 2. 493-493
  • Ogino T., Mitsugi M., Bando H., Miyahara Y., Enomoto H., Ozaki H. Anisotropy of the in-plane energy gap of Bi_2Sr_2CaCu_2O_<8+δ> single clystal. Meeting abstracts of the Physical Society of Japan. 2000. 55. 2. 545-545
  • Fujisawa H., Yaginuma S., Takahashi T., Miyahara Y., Ozaki H. Angel-resolved photoemission study of 1T-TiSe_2 : Origin of CDW. Meeting abstracts of the Physical Society of Japan. 2000. 55. 1. 538-538
  • Oi K., Bando H., Miyahara Y., Enomoto H., Ozaki H. 31a-ZF-11 Tunneling Spectroscopy on bonded Si(111) wafer II. Meeting abstracts of the Physical Society of Japan. 1999. 54. 1. 173-173
more...
Patents (4):
Books (1):
  • Kelvin Probe Force Microscopy
    Springer 2011 ISBN:9783642225659
Lectures and oral presentations  (15):
  • Investigation of thermoelectromotive force in Charge Density Wave State of TiSe_<2-x>S_x
    (Meeting abstracts of the Physical Society of Japan 2001)
  • Anisotropy of the in-plane energy gap of Bi_2Sr_2CaCu_2O_<8+δ> single clystal
    (Meeting abstracts of the Physical Society of Japan 2000)
  • Angle-resolved photoemission study of 1T-TiSe2 : excitonic insulator
    (Meeting abstracts of the Physical Society of Japan 2000)
  • Angel-resolved photoemission study of 1T-TiSe_2 : Origin of CDW
    (Meeting abstracts of the Physical Society of Japan 2000)
  • 31a-ZF-11 Tunneling Spectroscopy on bonded Si(111) wafer II
    (Meeting abstracts of the Physical Society of Japan 1999)
more...
Professional career (1):
  • Doctor of Engineering (Waseda University)
Work history (5):
  • 2019/01 - 現在 Texas State University Department of Physics Assistant Professor
  • 2002/06 - 2018/12 McGill University Research Associate
  • 2011/01 - 2013/09 McGill University Course Lecturer
  • 1997/06 - 2002/05 Ecole Polytechnique Federale de Lausanne Research Associate
  • 1995/04 - 1997/03 Waseda University Reseach Associate
Association Membership(s) (1):
THE JAPAN SOCIETY OF APPLIED PHYSICS
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