2016 - 2020 Fundamental research and development of low-loss p-type SiC superjunction power MOSFETs
2017 - 2020 新規前駆体熱酸化手法によるSiC絶縁膜界面制御技術の開発とトランジスタ応用
2014 - 2016 Development of SiC MOSFETs with High Channel Mobility by Incorporation of New Interface Passivation Elements
2009 - 2011 ワイドギャップ半導体SiCを用いたMOS構造における界面電子物性の解明
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Papers (39):
Mitsuru Sometani, Yusuke Nishiya, Ren Kondo, Rei Inohana, Hongyu Zeng, Hirohisa Hirai, Dai Okamoto, Yu-ichiro Matsushita, Takahide Umeda. Energy levels of carbon dangling-bond center (PbC center) at 4H-SiC(0001)/SiO2 interface. APL Materials. 2023
Tetsuo Hatakeyama, Hirohisa Hirai, Mitsuru Sometani, Dai Okamoto, Mitsuo Okamoto, Shinsuke Harada. Dipole scattering at the interface: The origin of low mobility observed in SiC MOSFETs. Journal of Applied Physics. 2022. 131. 14. 145701-145701
Hiroki Sakata, Dai Okamoto, Mitsuru Sometani, Mitsuo Okamoto, Hirohisa Hirai, Shinsuke Harada, Tetsuo Hatakeyama, Hiroshi Yano, Noriyuki Iwamuro. Accurate Determination of Threshold Voltage Shift during Negative Gate Bias Stress in 4H-SiC MOSFETs by Fast On-the-fly Method. Japanese Journal of Applied Physics. 2021. 60. 6. 060901-060901
Xufang Zhang, Tsubasa Matsumoto, Ukyo Sakurai, Toshiharu Makino, Masahiko Ogura, Satoshi Yamasaki, Mitsuru Sometani, Dai Okamoto, Hiroshi Yano, Noriyuki Iwamuro, et al. Energy distribution of Al2O3/diamond interface states characterized by high temperature capacitance-voltage method. Carbon. 2020. 168. 659-664
Hiroki Nemoto, Dai Okamoto, Xufang Zhang, Mitsuru Sometani, Mitsuo Okamoto, Tetsuo Hatakeyama, Shinsuke Harada, Noriyuki Iwamuro, Hiroshi Yano. Conduction mechanisms of oxide leakage current in p-channel 4H-SiC MOSFETs. Japanese Journal of Applied Physics. 2020. 59. 4. 044003