Study of dynamic surface structure change by RHEED
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Papers (68):
Chiaki Ishii, Yukichi Shigeta. Structural changes due to reannealing of Ge thin films prepared by solid phase epitaxial growth on Si (111) surface. Thin Solid Films. 2020. 709. 138007-138007
Tosaka Aki, Sugiyama Takuhiro, Shigeta Yukichi. Analysis of √31×√31 R9°structure on Al2O3(0001) with Reflection High Energy Electron Diffraction 3. Meeting Abstracts of the Physical Society of Japan. 2016. 71. 2325-2325
Koyama Kouji, Takeda Hidetoshi, Aida Hideo, Nakata Junya, Sugiyama Takuhiro, Tosaka Aki, Shigeta Yukichi. C12 Sub-surface damage layer evaluation of polished SiC surface by RHEED. The ... Manufacturing & Machine Tool Conference. 2012. 2012. 9. 149-150
Nakata Junya, Sugiyama Takuhiro, Koyama Kouji, Tosaka Aki, Shigeta Yukichi. 20aFF-9 Structure of GaN (0001) surface prepared by CMP with RHEED. Meeting abstracts of the Physical Society of Japan. 2012. 67. 2. 833-833
Sugiyama Takuhiro, Koyama Kouji, Tosaka Aki, Shigeta Yukichi. 20aFF-10 Change of α-Al_2O_3(0001) Surface Structure with Preparation Temperature in Air. Meeting abstracts of the Physical Society of Japan. 2012. 67. 2. 833-833
Sugiyama Takuhiro, Koyama Kouji, Tosaka Aki, Shigeta Yukichi. 24aCC-4 Step Morphology and Surface Reconstruction of the α-Al_2O_3(0001). Meeting abstracts of the Physical Society of Japan. 2012. 67. 1. 931-931
重田 諭吉. 横浜市立大学大学院 生命ナノシステム科学研究科 ナノシステム科学専攻 表面科学研究室. 電気学会論文誌. A, 基礎・材料・共通部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A, A publication of Fundamentals and Materials Society. 2010. 130. 9. 843-843
Fine Analysis of Surface Structure by using Kikuchi Envelope of Reflection High-Energy Electron Diffraction
(15th European Vacuum Conference (EVC-15) 2018)