Art

J-GLOBAL ID：200902083166716661   Reference number：90A0563766

Scanning tunneling microscope to reveal surface roughness.

表面粗さSTM

Author (4)： HAYASHI MASAKAZU (東芝) ,  ISHIDA FUMIHIKO (東芝) ,  KOMATSU TADANORI (東芝) ,  TSUDA NOBUHIRO (計量研)
Material： 精密工学会誌  (Journal of the Japan Society for Precision Engineering)
Volume： 56  Issue： 5  Page： 873-878  Publication year： May. 1990 
JST Material Number： F0268A  ISSN： 0912-0289  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)

Thesaurus term： simulation model ,...
Semi thesaurus term： STM

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JST classification (1)： Measuring methods and instruments of length,area,cross section,volume,angle  (AD05020O)

Reference (8)：

• 1) M. Green, M. Richter, J. Kortright, T. Barbee, R. Carr and I. Lindau : Scanning Tunneling Microscopy of X-ray Optics, J. Vac. Sci. Technol., A, 6, 2, (1988) 428.
• 2) S. T. Smith, D. G. Chetwynd and D. K. Bowen : Design and Assessment of Monolithic High Precision Translation Mechanisms, J. Phys. E : Sci. Instrum., 20, (1987) 977.
• 3) 津田展宏, 山田啓文, 石田文彦, 宮下正之, 山口正高 : 大ストロークSTM, 精密工学会誌, 55, 1 (1989) 146.
• 4) P. Muralt, D. W. Pohl and W. Denk : Wide-range, Low-operating-voltage, Bimorph STM : Application as Potentiometer, IBM J. Res. Develop., 30, 5, (1986) 443.
• 5) J. R. Matey, R. S. Crandall, B. Brycki and G. A. D. Briggs : Bimorph-driven x-y-z Translation Stage for Scanned Image Microscopy, Rev. Sci. Instrum., 58, 4, (1987) 567.

Terms in the title (2)： 表面粗さ ,  STM