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J-GLOBAL ID:200902103735506868   Reference number:98A0349004

Observation of the single electron charging effect in nanocrystalline silicon at room temperature using atomic force microscopy.

原子間力顕微鏡を用いた室温におけるナノ結晶シリコン中の単一電子帯電効果の観察
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Volume: 72  Issue:Page: 1089-1091  Publication year: Mar. 02, 1998 
JST Material Number: H0613A  ISSN: 0003-6951  CODEN: APPLAB  Document type: Article
Article type: 短報  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Metal-insulator-semiconductor structures 

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