Surface state density distribution of semiconducting diamond films measured from the Al/CaF<sub>2</sub>/i-diamond metal-insulator-semiconductor diodes and transistors.

YUN Y; MAKI T; KOBAYASHI T

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J-GLOBAL ID：200902111482757705 Reference number：97A0933864

Surface state density distribution of semiconducting diamond films measured from the Al/CaF₂/i-diamond metal-insulator-semiconductor diodes and transistors.

Al/CaF₂/i-ダイヤモンド構造の金属-絶縁体-半導体ダイオード及びトランジスタから測定した半導性ダイヤモンド膜の表面状態密度分布

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Author (3)： , ,
Material：
Volume： 82 Issue： 7 Page： 3422-3429 Publication year： Oct. 01, 1997
JST Material Number： C0266A ISSN： 0021-8979 CODEN： JAPIAU Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Metal-insulator-semiconductor structures , Electronic structure of surfaces

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Surface state density distribution of semiconducting diamond films measured from the Al/CaF2/i-diamond metal-insulator-semiconductor diodes and transistors.

Surface state density distribution of semiconducting diamond films measured from the Al/CaF₂/i-diamond metal-insulator-semiconductor diodes and transistors.