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J-GLOBAL ID：200902118782159227
Reference number：97A0953897
Temperature dependence of reflection high-energy electron diffraction intensity from Si(111)-7×7 superlattice.
Si(111)-7×7超格子からの反射高エネルギー電子回折強度の温度依存性
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Author (3)：
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Material：
Volume：
15
Issue：
5
Page：
2569-2573
Publication year：
Sep. 1997
JST Material Number：
C0789B
ISSN：
0734-2101
CODEN：
JVTAD6
Document type：
Article
Article type：
原著論文
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Surface structure of semiconductors
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