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J-GLOBAL ID：200902121874071424
Reference number：02A0281072
Distinct correlation between CeO2 and YSZ in out-of-plane and in-plane mosaic dispersions of heteroepitaxial CeO2/YSZ/Si(001) films.
ヘテロエピタキシャルCeO2/YSZ/Si(001)膜の面外及び面内モザイク分散におけるCeO2とYSZの間の異なる相関
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Author (5)：
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Material：
Volume：
74
Issue：
5
Page：
693-697
Publication year：
May. 2002
JST Material Number：
D0256C
ISSN：
0947-8396
CODEN：
APHYCC
Document type：
Article
Article type：
原著論文
Country of issue：
Germany, Federal Republic of (DEU)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Oxide thin films
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