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J-GLOBAL ID：200902123035416478   Reference number：02A0555297

Ultrasonic Electronics. Measurement of Subsurface Defect Shape by Photoacoustic Microscopy.

光音響顕微鏡法による表層欠陥形状の測定

Author (4)： ENDOH H (Tohoku Gakuin Univ., Tagajyo, JPN) ,  MIYAMOTO K (Tohoku Gakuin Univ., Tagajyo, JPN) ,  HIWATASHI Y (Tohoku Gakuin Univ., Tagajyo, JPN) ,  HOSHIMIYA T (Tohoku Gakuin Univ., Tagajyo, JPN)
Material： Japanese Journal of Applied Physics. Part 1. Regular Papers, Short Notes & Review Papers  (Japanese Journal of Applied Physics. Part 1. Regular Papers, Brief Communications & Review Papers)
Volume： 41  Issue： 5B  Page： 3361-3362  Publication year： May. 30, 2002 
JST Material Number： G0520B  ISSN： 0021-4922  Document type： Article
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *internal defect ,...

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JST classification (2)： Other optical effects  (BM08040H) ,  Acoustical measurements and instrumentation  (BB03040R)

Reference (7)：

• 1) P. V. McLaughlin, Jr., M. G. Mirchandani and P. V. Ciekurs: Trans. ASME. J. Eng. Mater. Technol. 109 (1987) 146.
• 2) Y.-L. Wang, F.-Z. Shen and S.-T. Tu: Eng. Frac. Mech. 47 (1993) 39.
• 3) T. Hoshimiya, H. Endoh and Y. Hiwatashi: Jpn. J. Appl. Phys. 35 (1996) 2916.
• 4) H. Endoh, Y. Hiwatashi and T. Hoshimiya: Jpn. J. Appl. Phys. 36 (1997) 3312.
• 5) H. Endoh, S. Sugawara, R. Mukai, Y. Hiwatashi and T. Hoshimiya: Jpn. J. Appl. Phys. 37 (1998) 3140.

Terms in the title (3)： 光音響顕微鏡 ,  表層 ,  欠陥