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J-GLOBAL ID:200902130191457415   Reference number:01A0778456

Effects of Composition and Annealing on Shape Memory Behavior of Ti-Rich Ti-Ni Thin Films Formed by Sputtering.

スパッタリングで形成したTiリッチTi-Ni薄膜の形状記憶挙動に及ぼす組成及び焼なましの影響
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Material:
Volume: 42  Issue:Page: 1060-1067  Publication year: Jun. 2001 
JST Material Number: G0668A  ISSN: 1345-9678  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Other metallography 
Reference (23):
  • 1) S. Miyazaki and A. Ishida: Materia Japan 38 (1999) 279–280.
  • 2) A. D. Johnson: J. Microeng. 1 (1991) 34–41.
  • 3) K. Kuribayashi, M. Yoshitake and S. Ogawa: Proc. IEEE Micro Electro Mechanical Systems (MEMS-90) (1990) pp. 217–221.
  • 4) A. Ishida, A. Takei and S. Miyazaki: Thin Solid Films 228 (1993) 210–214.
  • 5) S. Miyazaki and A. Ishida: Mater. Trans., JIM 35 (1994) 14–19.
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