Art
J-GLOBAL ID:200902138915531435   Reference number:00A0407706

Ductile-to-brittle Transition in Microscratching Tests of Single Crystal Silicon.

単結晶シリコンの微小引っかき試験における延性/ぜい性遷移の研究
Author (3):
Material:
Volume: 66  Issue:Page: 619-623  Publication year: Apr. 05, 2000 
JST Material Number: F0268A  ISSN: 0912-0289  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=00A0407706&from=J-GLOBAL&jstjournalNo=F0268A") }}
JST classification (2):
JST classification
Category name(code) classified by JST.
Ceramic material testing  ,  Properties of ceramics and ceramic whiteware 

Return to Previous Page