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J-GLOBAL ID:200902144280628674   Reference number:98A0527389

Reduction of the Floating Body Effect in SOI MOSFETs by Using Schottky Source/Drain Contacts.

Schottkyソース/ドレイン接触を使ったSOI MOSFETの漂遊体効果の低減
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Volume: 37  Issue: 3B  Page: 1295-1299  Publication year: Mar. 1998 
JST Material Number: G0520B  ISSN: 0021-4922  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Transistors 
Reference (10):
  • 1) SOI Kozo Keisei Gijutsu, ed. S. Furukawa (Sangyo Tosho, Tokyo, 1987) [in Japanese].
  • 2) J. P. Collinge: Silicon-on-Insulator Technology: Materials to VLSI (Kluwer Academic Publishers, 1991).
  • 3) K. Arita, M. Akamatsu and T. Asano: Jpn. J. Appl. Phys. 36 (1997) 1505
  • 4) K. Arita, M. Akamatsu and T. Asano: Ext. Abstr. 1997 Int. Conf. Solid State Devices and Materials, Hamamatsu, 1997 (Business Center for Academic Society of Japan, Tokyo, 1997) p. 146.
  • 5) T. Saraya, M. Takamiya, T. N. Duyet and T. Hiramoto: Ext. Abstr. 1997 Int. Conf. Solid State Devices and Materials, Hamamatsu, 1997 (Business Center for Academic Society of Japan, Tokyo, 1997) p. 554.
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