Art
J-GLOBAL ID：200902156856529365
Reference number：96A0902362
Real-Time Ellipsometric Measurement during Growth of (AlxGa1-x)0.52In0.48P Thin Films.
(AlXGa1-X)0.52In0.48P薄膜成長時の実時間偏光解析測定
-
Publisher site
Copy service
{{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=96A0902362©=1") }}
-
Access JDreamⅢ for advanced search and analysis.
{{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=96A0902362&from=J-GLOBAL&jstjournalNo=G0520B") }}
Author (4)：
,
,
,
Material：
Volume：
35
Issue：
9A
Page：
4595-4598
Publication year：
Sep. 1996
JST Material Number：
G0520B
ISSN：
0021-4922
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
JST classification (2)：
JST classification
Category name(code) classified by JST.
Polarimetry and polarimeters
, Semiconductor thin films
Reference (15)：
-
HOTTIER, F. Appl.Phys.Lett. 1981, 38, 863
-
COLLINS, R. W. Anal.Chem. 1990, 62, 887
-
YAKOVLEV, Y. J.Appl.Phys. 1993, 74, 2535
-
KAWABATA, S. Oyo Buturi. 1988, 57, 1868
-
URBAN, F. K. Appl.Opt. 1993, 32, 2339
ｍore...
Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
,
,
Return to Previous Page
