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J-GLOBAL ID:200902158678310551   Reference number:02A0356035

Formation of Surface Oxide Layer on CdTe and Reduction of Surface Leakage Current by Inductively Coupled O2 Plasma Treatment.

誘導結合型酸素プラズマ処理によるCdTe表面酸化層の形成と表面リーク電流低減効果
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Volume: J85-C  Issue:Page: 285-292  Publication year: Apr. 01, 2002 
JST Material Number: S0623C  ISSN: 1345-2827  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Materials of solid-state devices  ,  Radiation detection and detectors 
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