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J-GLOBAL ID:200902169252169926   Reference number:96A0671685

Microstructural evolution and preferred orientation change of radio-frequency-magnetron sputtered ZnO thin films.

高周波マグネトロンスパッタリングにより蒸着したZnO薄膜の微細構造発展と優先配向の変化
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Volume: 14  Issue: 3 Pt 2  Page: 1943-1948  Publication year: May. 1996 
JST Material Number: C0789B  ISSN: 0734-2101  CODEN: JVTAD6  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Oxide thin films 

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