Art
J-GLOBAL ID：200902172636342740   Reference number：00A0327353

On the grain boundary segregation of Sn in indium-tin-oxide thin films.

酸化インジウム-すず薄膜におけるSnの結晶粒界偏析
Author (3)：
MORIKAWA H

About MORIKAWA H

(Nagoya Inst. Technol., Nagoya, JPN)

About Nagoya Inst. Technol., Nagoya, JPN

, 
KURATA H

About KURATA H

(Japan Atomic Energy Res. Inst., Ibaraki, JPN)

About Japan Atomic Energy Res. Inst., Ibaraki, JPN

, 
FUJITA M

About FUJITA M

(Nagoya Inst. Technol., Nagoya, JPN)

About Nagoya Inst. Technol., Nagoya, JPN


Material：
Journal of Electron Microscopy  (電子顕微鏡学会誌)

About Journal of Electron Microscopy


Volume： 49  Issue： 1  Page： 67-72  Publication year： 2000 
JST Material Number： G0104A  ISSN： 0022-0744  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)
Thesaurus term：
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indium oxide

About indium oxide

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
ITO(solid solution)

About ITO(solid solution)


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JST classification (1)：
JST classification
Category name(code) classified by JST.
Semiconductor thin films 
(BK14040E)

About Semiconductor thin films

Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
酸化インジウム

About 酸化インジウム

, 
すず

About すず

, 
薄膜

About 薄膜

, 
Sn

About Sn

, 
結晶粒界偏析

About 結晶粒界偏析


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