Art
J-GLOBAL ID:200902176284075016
Reference number:02A0322513
Effect of O2 gas partial pressure on mechanical properties of SiO2 films deposited by radio frequency magnetron sputtering.
高周波マグネトロンスパッタリングにより堆積したSiO2膜の機械的性質に及ぼすO2ガス分圧の効果
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Author (3):
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Material:
Volume:
20
Issue:
2
Page:
356-361
Publication year:
Mar. 2002
JST Material Number:
C0789B
ISSN:
0734-2101
CODEN:
JVTAD6
Document type:
Article
Article type:
原著論文
Country of issue:
United States (USA)
Language:
ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
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JST classification (2):
JST classification
Category name(code) classified by JST.
Oxide thin films
, Mechanical properties of solids in general
Terms in the title (6):
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