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J-GLOBAL ID:200902176284075016   Reference number:02A0322513

Effect of O2 gas partial pressure on mechanical properties of SiO2 films deposited by radio frequency magnetron sputtering.

高周波マグネトロンスパッタリングにより堆積したSiO2膜の機械的性質に及ぼすO2ガス分圧の効果
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Volume: 20  Issue:Page: 356-361  Publication year: Mar. 2002 
JST Material Number: C0789B  ISSN: 0734-2101  CODEN: JVTAD6  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Oxide thin films  ,  Mechanical properties of solids in general 

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