Degradation of MOSFETs on SIMOX by irradiation.

HAKATA T; OHYAMA H; SIMOEN E; CLAEYS C; MIYAHARA K; KAWAMURA K; OGITA Y; TAKAMI Y

Art

J-GLOBAL ID：200902184849325103 Reference number：99A0272850

Degradation of MOSFETs on SIMOX by irradiation.

照射によるSIMOX上のMOSFETsの劣化

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Author (8)： , , , , , , ,
Material：
Volume： 239 Issue： 2 Page： 357-360 Publication year： Feb. 1999
JST Material Number： B0949B ISSN： 0236-5731 CODEN： JRNCDM Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Irradiational changes semiconductors , Transistors

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