Art

J-GLOBAL ID：200902189942297898   Reference number：97A0019539

Simulation of Electron Trajectories of Wien Filter for High-Resolution EELS Installed in TEM.

TEMに装備した高分解能EELS用Wienフィルタの電子軌道シミュレーション

Author (2)： TSUNO K (JEOL Ltd., Tokyo, JPN) ,  ROUSE J (Munro’s Electron Beam Software Ltd., London, GBR)
Material： Journal of Electron Microscopy  (電子顕微鏡学会誌)
Volume： 45  Issue： 5  Page： 417-427  Publication year： Oct. 1996 
JST Material Number： G0104A  ISSN： 0022-0744  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： transmission electron microscope ,...

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JST classification (1)： Electron and ion microscopes  (BD02050B)

Reference (13)：

• KOHASHI, T. A spin rotator for detecting all three magnetization vector components by spin-polarized scanning electron microscopy. Rev Sci Instrum. 1995, 66, 5537-5543
• NICHLAUS, M. A wave-packet-shifting device for restoring longitudinal coherence in charged-matter-wave interferometers. Phys Rev A. 1993, 48, 152-160
• TANG, TT. Aberration analysis of a crossed-field analyzer. Optik. 1986, 74, 51-56
• ROSE, H. The retarding Wien filter as a high-performance imaging filter. Optik. 1987, 77, 26-34
• SCHEINFEIN, MR. Second order transfer matrices for inhomogeneous field Wien filters including spin-precession. Optik. 1989, 82, 99-113

Terms in the title (7)： TEM ,  装備 ,  高分解能 ,  EELS ,  Wienフィルタ ,  電子軌道 ,  シミュレーション